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Simulated E-Bomb Effects on Electronically Equipped Targets

机译:模拟电子炸弹对电子设备目标的影响

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Like High Altitude Electromagnetic Pulse (HEMP), high power microwaves (HPM) produce intense energies, which may overload or damage various electrical system components such as microcircuits. This thesis investigates possible effects of a hypothetically designed HEMP-like weapon, an 'e-bomb,' on electronically equipped target systems. The procedure to determine these possible effects is to estimate the electromagnetic coupling from first principles and simulations using a coupling model program (CEMPAT), pursuing a feasible geometry of attack, practical antennas, best coupling approximations of ground conductivity and permittivity, a reasonable system of interest representation from specifications, threat waveshape and operating frequency. The analysis procedure investigates roles of these factors contributes to the e- bomb coupling scenario. Those possible e-bomb effect results are then compared to a published and experimentally created threshold level table to determine whether any upset or damage is formed on the target system. Based on this comparison, the results are evaluated with respect to the factors that caused them to exceed, or not exceed, the threshold levels. Additionally, a conventional weapon attack scenario for the same target system is created. Its results are compared to the e-bomb attack. Finally, operational recommendations are given along with advantages and disadvantages for each type of attack.

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