PHOTOSENSITIVITY AND SECONDARY ELECTRON EMISSION FROM OXYGEN CESIUM LAYERS IN DIFFUSION PROCESSES

摘要

Statistically correlated data are reported on changes in photosensitivity and secondary electron emission associated with an increased number of metallic silver particles in the layernCs—Cs 0, Cs, Ag—Ag0, Ag (results obtained for 16 different devices). A Japanese method was used to introduce, an excess of metallic particles into the layer. The results obtained are discussed with respect to the origin of photo and secondary electron emission observed in such layers.