A High-Speed Infrared Mapping System for Reliability Assessment of Miniature Electronic Circuits

摘要

Describes current progress at NEL in development of a high-speed infrared mapping system for reliability assessment of miniature electronic circuits. Surface area of circuit tested is scanned. Output of indium antimonide IR detector is recorded. Black and white IR energy maps are produced by direct writing. Small temperature differences from surface areas small as 0.001 in. sq can be read back by densitometer techniques. Temperature recording range and bandwidth are adjustable. Present equipment makes a 600-line map of a 1-in.-sq surface area in a 30-minute period at environmental temperature low as 60C. Further developments will provide higher resolution at slightly lower environmental temperatures. (Author)