Broadening and Shifting of Diffraction Profiles from Anti-Phase Domain Boundaries or Stacking Faults in a B2 Structure

摘要

Planar faults produce unusual effects in diffraction patterns. Some peaks are broadened while others are not. Antiphase domain boundaries (APDB) as well as stacking disorders fall in this category, although they affect only the superlattice reflections significantly. For an L12 structure, Cu3Au for example, it has been known for years that APDB on (braces : 100) do not affect the 100 superstructure reflection in a powder pattern, but the 110 peak is broadened considerably. This phenomenon has been used in studies of the kinetics of domain growth and in investigations of the nature of deformation of Cu3Au. It is the purpose of this paper to derive the effects on the diffraction pattern of various stacking faults and APDB in a B2 structure, and to apply the results to an examination of the line broadening of filed AgMg. (Author)