An Investigation of Current Mode Second Breakdown.

摘要

A discussion is given on current mode second breakdown and related effects. A general description of second breakdown for different circuit configurations is given. Mathematical and physical models are given that show the causes of current mode second breakdown and the levels at which it occurs. The unstable voltage and current ranges and the associated oscillations are discussed. Computer solutions are given for the sustaining voltage for several different doping profiles. Finally a discussion is given on breakdown voltages in punch through limited transistors. (Author)