Electronic Equipment Screening and Debugging Techniques.

摘要

This report presents the results of a quantitative investigation into the optimum selection of screening and debugging methods for the purpose of removing defects, and hence improving reliability, throughout the development process. A computerized optimization model has been developed which can be used to address three problem areas; (1) Select an optimum sequence of screens for a fixed dollar expenditure, (2) Select a sequence of screens which minimizes costs in the face of a fixed desired reliability improvement, and (3) Provide quantitative for performing screening/debugging tradeoffs. In order to implement the model it was necessary to obtain data to compute test strengths and test costs. The model includes four assembly levels, five types of screens (temperature cycling constant temperature, vibration constant power and power cycling), provides for introduction of defects at each assembly level and includes the rework cycle. (Author)