Optimum Testing Procedures for System Diagnosis and Fault Isolation

摘要

Even though a great deal of work has been done in developing models in the field of designing diagnostic tests for fault isolation in digital systems, there is still a lack of efficient and fast procedures. Two approaches to the cost-effective design of fault isolation procedures were presented here. They were oriented specifically toward built-in-test (BIT) diagnostic subsystems for modular electronic equipment. A branch and bound solution approach was used in order to find the optimal sequence of tests to be executed by the BIT to isolate a single malfunctioned unit among a group of line replaceable units. Computational results were presented and discussed. A computer program listing of the solution technique was included. (Author)