Liu Fault Diagnosis Investigation

摘要

This report is an investigation of the fault diagnosis algorithm attributed to Dr. Ruey-wen Liu at the University of Notre Dame. This approach is based on a faulty current concept in which a faulty component is modelled as a nominal component with a parallel fault current source. Since component faults trace a line in a measurement space as the fault current source takes on different values. Measurements take on a sample circuit from a point in the measurement space. The origin of the measurement space is the intersection of the fault lines of the various circuit components and represents the circuit with all components at their nominal values. The Liu fault diagnosis approach is to determine which fault line is closest to the measurement point of the sample circuit. The circuit used to evaluate the Liu approach is an eight-resistor bridged-T dc network. This nonreactive circuit has been chosen to keep the results simple enough to provide insight into the approach.