BIT/BITE Tradeoff Analysis Model

摘要

This document is a discussion of the fundamental methodologies employed in the BIT/BITE TRADEOFF ANALYSIS MODEL. The model is designed to facilitate rapid evaluations of cost interactions and sensitivity to testability policies and associated test equipment. The primary objective is to develop a computer model that will assist the user in the selection of a cost-effective test policy for the life cycle of a proposed weapon system. The model is designed so that different approaches to sub-analysis can be selected on a data available basis to conduct tradeoff analyses between/among Built-In-Test, Built-In-Test Equipment, Automatic, Semi-Automatic, Manual Test Equipment and Sample Inspection Equipment that will test to levels necessary to support depot, intermediate rear, intermediate forward, and operational areas. The model is designed to highlight test methodology cost impact and compute the total life cycle costs of the system.