首页> 美国政府科技报告 >Identification of Scattering Mechanisms from Measured Impulse Response Signatures of Several Conducting Objects
【24h】

Identification of Scattering Mechanisms from Measured Impulse Response Signatures of Several Conducting Objects

机译:从几个导体的测量脉冲响应特征识别散射机制

获取原文

摘要

The backscattered impulse response of several perfectly conducting objects has been measured and qualitatively compared to several theoretical predictions. The value of the impulse response waveform as a time history of scattering behavior is due to its unique relationship to geometry of the scatterer. This relationship is explored for local diffraction mechanisms, multiple diffraction between separate points on the scatterer, creeping waves, and natural resonances. Finally, it is demonstrated that a time domain view of a high frequency solution such as the Uniform Geometrical Theory of Diffraction offers a physically intuitive explanation for individual scattering mechanisms and multiple interactions. (Author)

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号