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Calculation of the Electron Velocity Distribution in High Electron Mobility Transistors Using an Ensemble Monte Carlo Method

机译:用集合蒙特卡罗方法计算高电子迁移率晶体管中的电子速度分布

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The electron velocity distribution is calculated for an idealized model of the high electron mobility transistor using a many-particle Monte Carlo model and a self-consistent two-dimensional Poisson solver. Hot electron effects, nonstationary effects, and real space transfers are analyzed. The results show that significant velocity overshoot 2.8 X 10 to the 7th power cm/s at 300 K and 3.7 X 10 to the 7th power cm/s at 77 K exists under the gate and that the velocity overshoot is limited by both k-space transfer and real-space transfer. The values of the overshoot velocities are much smaller than those obtained from the more conventional drift-diffusion model.

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