High Precision Materials Characterization in the Near Millimeter Wave-Length Range.

摘要

A double-beam instrument developed in this laboratory has been used to measure the complex indices of refraction of various material at 245 GHz. We report here the results for crystal quartz, water free fused quartz (Spectrasil WF), silicon, beryllia, boron nitride (grade HP), and a nickel ferrite (Trans-Tech 2-111). We compare our results with the results obtained by other researchers using different techniques as available.