Computerized Tool for Studying Two-Dimensional Images of Spectroscopic Sources

摘要

Computer control of two-dimensional optical-imaging instrumentation and the collection, manipulation and storage of data from these devices provides an accurate means of rapidly characterizing spectroscopic emission sources. Spectrometric apparatus can be designed and improved based on the observations of complete profiles of such sources. The spatial and temporal characteristics of the sample-dependent emission signal are invaluable in understanding sources used for chemical analysis. This paper describes an integrated tool whereby a first-generation SIT Vidicon/OMA has been interfaced to an IMB-PC. The utility and versatility of the system is illustrated with examples of spatially resolved spectroscopic emission from an inductively coupled plasma and a comparison of the emission profiles from two different microwave-induced plasma systems.