SEU (Single Event Upset) Tolerance of McDonnell Douglas' CMOS/SOS High Performance 3 Chip Implementation of MIL-STD-1750A Instruction Set

摘要

A single event upset (SEU) experiment was conducted on the control unit (CU) chip of McDonnell Douglas' 1750A microprocessor (called the MD281), as a joint effort of McDonnell Douglas Corporation and The Aerospace Corporation at the 88 inch cyclotron, Lawrence Berkeley Laboratory. No upset was detected using a 140 MeV krypton beam. Test results, geometry, and process parameters are used to predict a failure threshold and an upset rate. (Author)