Imaging of Stacking Faults in Highly Oriented Pyrolytic Graphite Using ScanningTunneling Microscopy

摘要

Scanning tunneling microscopy images of the (0001) plane of highly orientedpyrolytic graphite show defect regions consisting of an extensive network of partial dislocations that form extended and contracted nodes. The partial dislocations in hexagonal graphite enclose triangular regions (about 1000 nm on a side) of faulted material comprised of rhombohedral graphite. Tunneling spectroscopy shows differences in the dependence of the tunneling current on voltage between the faulted and unfaulted regions. Electronic and elastic interactions of the tip with the HOPG surface are proposed to explain the observed image contrast between hexagonal and rhombohedral graphite. (ttl)