Electron-Beam-Pinch Experiment at Harry Diamond Laboratories: Providing for aHigh-Dose-Rate Flash X-ray Facility for Transient Radiation Effects on Electronics (TREE) Testing of Pieceparts

摘要

The peak photon-radiation dose rate of the High-Intensity Flash X-Ray facilityhas been increased by at least a factor of five through the use of custom beam-pinching hardware. With this hardware, the facility can now routinely provide a dose rate of 2.7 times 10 to the 11th power rads(Si)/s, at a distance of 1/4 in. from the drift-tube face, while providing excellent radial drop-off to minimized irradiation of items surrounding the device under test. The experimental results show the optimum operating parameters of the beam-pinching hardware to be a drift-tube length equal to 6 cm with an internal nitrogen gas pressure of 0.1 Torr.