Significance of a Carbon-Rich Background in Plasma-Based Graphene Oxide Reduction.

摘要

The reduction of oxygen concentration in graphene oxide is demonstrated using electron beam generated plasmas produced in three different gas backgrounds: Ar, Ar/H2 and Ar/CH4. Plasma diagnostics and surface characterizations are combined to determine the influence of each working gas on the chemical composition and structure of graphene oxide before and after reduction. The results suggest that argon treatment alone allows the removal of weakly bound oxygen in graphene oxide by inert ion bombardment, while the addition of hydrogen adds reactive species that enhance the removal of oxygen. However, without a carbon source, removing oxygen from graphene oxide can lead to the formation of defects and vacancies. We find that methane provides not only hydrogen but also the carbon necessary to restore the graphitic plane by healing defects generated during reduction.