Direct Imaging of the Surface Microstructure of Dielectric Materials Using anAtomic Force Microscope

摘要

An atomic force microscope was acquired and used to study the surface propertiesof polymers and ceramics. Studies of polymers included nanomachining, mechanical properties, wetting behavior of latex, and metallization. Studies of ceramics included faceting of TiO2 morphology of oxide fracture surfaces, heteroepitaxial oxide film growth, and oxidation of vanadium carbide. A prototype instrument for use in ultra-high vacuum was designed. Atomic force microscope, Ceramics, Polymers, Surface structure, Thin films, Adhesion, Micromechanics.