Measurements of Light Scattering by a Series of Conducting Surfaces with One-Dimensional Roughness

摘要

Measurements of the polarization dependence of the coherent and diffuse scatterfrom a set of seven conducting surfaces with strictly one dimensional roughness are presented. The surfaces have been fabricated in gold with photoresist techniques and have been accurately characterized with stylus profilometry. The standard deviation of surface height sigma varies between 0.25 and 1.73 microns throughout the series of surfaces, but all have height statistics that are close to Gaussian and a correlation length that is nearly fixed at 3.3 microns. The polarization dependence of the scattered intensity is fully specified by the four unique elements of the Stokes matrix, which are determined from six intensities measured with different polarization conditions. In studies of the coherent