首页> 美国政府科技报告 >Development of Ultra-Low Noise, High Performance III-V Quantum Well InfraredPhotodetectors (QWIPs) for Focal Plane Array Staring Image Sensor Systems
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Development of Ultra-Low Noise, High Performance III-V Quantum Well InfraredPhotodetectors (QWIPs) for Focal Plane Array Staring Image Sensor Systems

机译:开发用于焦平面阵列凝视图像传感器系统的超低噪声,高性能III-V量子阱红外光电探测器(QWIp)

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During this reporting period (02-01-94 to 04-30-94) we have continued to makeexcellent progress. We report two new normal incidence p-type strained-layer III-V quantun well infrared photodetectors (QWIPs) for 3-5 and 8-14 um detection. An ultra-low dark current p-type tensile strained-layer (PTSL) In(0.3)Ga(0.7)As/In(0.52)Al(0.48)As QWIP grown on InP by MBE for 8-14 um detection has been developed. It shows BLIP for T<100 K. Due to a 1.5% lattice mismatch between the substrate and quantum well, a biaxial tensile strain was created in the well layers. As a result, the light-hole state becomes the ground state for the free hole with small effective mass. The dramatic increase of optical absorption can be attributed to the large in-plane density of states and

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