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Influence of p-GaN annealing on the optical and electrical properties of InGaN/GaN MQW LEDs

机译:p-GaN退火对InGaN / GaN MQW LED光学和电学性质的影响

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摘要

Optical and electrical properties of InGaN/GaN multiple quantum wells (MQWs) light emitting diodes(LEDs) annealed in pure O_2 ambient (500 ℃) and pure N_2 ambient (800 ℃) were systematically investigated. The temperature-dependent photo luminescence measurements showed that high-temperature thermal annealing in N_2 ambient can induce indium clusters in InGaN MQWs. Although the deep traps induced by indium clusters can act as localized centers for carriers, there are many more dislocations out of the trap centers due to high-temperature annealing. As a result, the radiative efficiency of the sample annealed in N_2 ambient was lower than that annealed in O_2 ambient at room temperature. Electrical measurements demonstrated that the LEDs annealed in O_2 ambient were featured by a lower forward voltage and there was an increase of ~41 % in wall-plug efficiency at20 mA in comparison with the LEDs annealed in N_2 ambient. It is thus concluded that activation of the Mg-doped p-GaN layer should be carried out at a low-temperature O_2 ambient so as to obtain LEDs with better performance.
机译:系统地研究了在纯O_2环境(500℃)和纯N_2环境(800℃)下退火的InGaN / GaN多量子阱(MQWs)发光二极管(LED)的光电性能。与温度有关的光致发光测量表明,在N_2环境中进行高温热退火可以在InGaN MQWs中诱导铟簇。尽管由铟团簇引起的深陷阱可以充当载流子的局部中心,但是由于高温退火,陷阱中心之外还有更多的位错。结果,在室温下在N_2环境下退火的样品的辐射效率低于在O_2环境下退火的样品的辐射效率。电气测量表明,在O_2环境中退火的LED具有较低的正向电压,与在N_2环境中退火的LED相比,在20 mA下壁挂效率提高了〜41%。因此得出结论,应在低温O_2环境下进行Mg掺杂的p-GaN层的活化,以获得性能更好的LED。

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