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Current-voltage and low-frequency noise characteristics of structures with porous silicon layers exposed to different gases

机译:多孔硅层暴露于不同气体的结构的电流电压和低频噪声特性

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摘要

Current-voltage and noise characteristics of porous silicon (PS)/single crystalline silicon (SCS) samples were measured under exposure to dry air, air +0.4% CO, dry air +1.7% CO, and dry air + ethyl alcohol vapor. The samples have a sandwich structure comprising Al/PS/SCS/Al. For the dry air + CO mixtures, the noise level was sensitive not only to the presence of CO but also to its percentage, and an increase of the CO concentration led to a change in the spectral density function of the low-frequency noise. (C) 2007 Elsevier B.V. All rights reserved.
机译:在暴露于干燥空气,空​​气+ 0.4%CO,干燥空气+ 1.7%CO和干燥空气+乙醇蒸气的条件下测量了多孔硅(PS)/单晶硅(SCS)样品的电流-电压和噪声特性。样品具有包含Al / PS / SCS / Al的夹心结构。对于干燥空气+ CO混合物,噪声水平不仅对CO的存在也很敏感,而且对百分比也很敏感,CO浓度的增加导致低频噪声的频谱密度函数发生变化。 (C)2007 Elsevier B.V.保留所有权利。

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