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首页> 外文期刊>Physica status solidi, B. Basic research >Semiconductor-metal transition in many-valley semiconductors
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Semiconductor-metal transition in many-valley semiconductors

机译:多谷半导体中的半导体-金属过渡

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摘要

The common conclusion that the Thomas-Fermi approximation for screening leading to a poor estimate of the critical donor concentration for a metal-insulator transition in many-valley semi conductors is critically examined. The many-body effects are introduced in a simple way, partly in the kinetic energy term as a mass renormalization in the spirit of the Fermi liquid theory and partly in the potential energy term when random distribution of impurities leading to Anderson localization is considered. In the absence of localization we obtain a*N-c(1/3) = 0.36 nu(-1/3), for the value of Mott constant, where nu refers to the number of equivalent conduction band minima and a* is the orbit size of the donor electron in the semiconductor. When an impurity distribution is included we lose a simple expression as given above; instead we get an expression for the energy containing two parameters, the mass in the kinetic energy and the distribution parameter alpha in the potential energy. The mass is fixed choosing the ionization energy of an isocoric impurity in the low doping regime, and the value of a is fixed demanding the vanishing of the donor binding energy. Thus we are able to account for the variation of the binding energy with the donor concentration for several donors in Si and Ge. Our results are compared with the existing data, and the agreement is good. [References: 35]
机译:严格检验了一个普遍的结论,即检查的Thomas-Fermi近似导致对多谷半导体中金属-绝缘体过渡的临界供体浓度的估算不佳。多体效应以一种简单的方式引入,部分是根据费米液体理论的精神,以动能术语作为质量重整化,而部分是以势能术语引入,当考虑到导致安德森局部化的杂质的随机分布时。在没有定位的情况下,对于莫特常数的值,我们获得a * Nc(1/3)= 0.36 nu(-1/3),其中nu表示等效导带最小值的数量,而a *是轨道尺寸半导体中供体电子的数量当包含杂质分布时,我们将失去上面给出的简单表达式;相反,我们获得了一个包含两个参数的能量表达式,动能质量和势能分布参数alpha。质量在低掺杂状态下选择等皮质杂质的电离能是固定的,而a的值是固定的,要求消失供体结合能。因此,我们能够解释在Si和Ge中几个供体的结合能随供体浓度的变化。将我们的结果与现有数据进行比较,一致性很好。 [参考:35]

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