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Structural and transport properties of hot wall deposited CuInSe2 thin films and the fabrication of CuInSe2 based solar cells

机译:热壁沉积CuInSe2薄膜的结构和传输特性以及CuInSe2基太阳能电池的制造

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摘要

Films of CuInSe2 were deposited onto glass substrates by a hot wall deposition method under thermodynamic equilibrium condition using bulk CuInSe2 as a source material. All the deposited CuInSe2 films were found to be polycrystalline in nature exhibiting the chalcopyrite structure with the crystallite orientation along (101), (112), (103), (211), (220), (312) and (400) directions. The crystallites were found to have a preferred orientation along the (112) direction. Microstructural parameters of the films, such as grain size, dislocation density, tetragonal distortion and strain have been determined. The grain sizes in the films have been found in the range of 89 to 244 nm. Hall effect studies have been carried out on the hot wall deposited CuInSe2 thin films. Hall voltage has been measured as a function of temperature in the range 80 to 460 K. The obtained positive Hall voltage indicates that the prepared CuInSe2 films are of p-type nature with holes as majority charge carriers. The Hall co-efficient is found to decrease with increase in film thickness. The carrier concentration in CuInSe2 films is found to be of the order of 10(17) cm(-3). The carrier concentration is observed to increase with increase in film thickness. The Hall mobility is found to increase very slowly in the low temperature region from 80 to about 215 K, and then rapidly with increase in temperature above 215 K. The mobility is found to increase with increase in film thickness. The dependence of T-3/2 law for Hall mobility indicates that scattering on ionized impurities is predominant in the temperature region above 215 K in hot wall deposited CuInSe2 thin films. The grain boundary potential (E-b) of CuInSe2 thin films of different thickenesses has been evaluated. The barrier height is observed to decrease with increase in carrier concentration indicating the presence of partially depleted grains in CuInSe2 films. CuInSe2-based solar cells with CdS as buffer layer were fabricated. The fabricated solar cells were illuminated using 100 mW/cm(2) white light under AM1 conditions. The current and voltage were measured using an optical power meter and an electrometer, respectively. The solar cell parameters, open circuit voltage (V-oc), short circuit current (I-sc), series resistance (R-s), shunt resistance (R-sh), power maximum (P-max) and fill factor (F-F) were determined.
机译:使用块状CuInSe2作为原料,在热力学平衡条件下,通过热壁沉积法将CuInSe2的膜沉积在玻璃基板上。发现所有沉积的CuInSe 2膜本质上都是多晶的,具有黄铜矿结构,其具有沿(101),(112),(103),(211),(220),(312)和(400)方向的微晶取向。发现微晶沿着(112)方向具有优选的取向。已经确定了膜的微观结构参数,例如晶粒尺寸,位错密度,四方形畸变和应变。已经发现膜的晶粒尺寸在89至244nm的范围内。在热壁沉积的CuInSe2薄膜上进行了霍尔效应研究。已经测量了霍尔电压随温度在80至460 K范围内的变化。所获得的正霍尔电压表明所制备的CuInSe2薄膜具有p型性质,其中空穴作为多数电荷载流子。发现霍尔系数随着膜厚度的增加而降低。发现CuInSe2薄膜中的载流子浓度约为10(17)cm(-3)。观察到载流子浓度随着膜厚度的增加而增加。发现霍尔迁移率在从80到215 K的低温区域中非常缓慢地增加,然后随着温度在215 K以上的增加而迅速增加。发现迁移率随着膜厚度的增加而增加。 T-3 / 2定律对霍尔迁移率的依赖性表明,在热壁沉积的CuInSe2薄膜中,在215 K以上的温度区域中,电离杂质的散射主要存在。评价了不同厚度的CuInSe2薄膜的晶界势(E-b)。观察到势垒高度随载流子浓度的增加而降低,表明在CuInSe2膜中存在部分耗尽的晶粒。制备了以CdS为缓冲层的CuInSe2基太阳能电池。在AM1条件下,使用100 mW / cm(2)的白光照明所制造的太阳能电池。分别使用光功率计和静电计测量电流和电压。太阳能电池参数,开路电压(V-oc),短路电流(I-sc),串联电阻(Rs),分流电阻(R-sh),最大功率(P-max)和填充系数(FF)被确定。

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