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首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >A mathematical model based on the limit dilution method to obtain linear calibration curves which eliminate the matrix effect in quantitative analysis by X-ray fluorescence
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A mathematical model based on the limit dilution method to obtain linear calibration curves which eliminate the matrix effect in quantitative analysis by X-ray fluorescence

机译:基于极限稀释法的数学模型,获得线性校正曲线,从而消除了X射线荧光定量分析中的基质效应

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摘要

We propose a mathematical model from an analytical application viewpoint inspired in the limit dilution method. The theoretical development of the model and its results are given The model shows that there is a linear relation between the inverse of fluorescence intensity and the inverse of the dilution factor; each analytic system (sample, diluent and analyte) is characterised by a general linear function which is easily obtained. The analytical applications arising from this linearity are of greatimportance in X-ray fluorescence analysis. The following immediate applications are proposed: direct procurement of the total correction factor Y/H, rapid calculation of the fluorescence intensity of the analyte in a sample (I_i~s) and direct calculationof the corrected fluorescence intensity (I_i~(sF)). The suggested model makes it possible to deduce a linear function between the fluorescence intensity of the analyte and the analyte concentration in successive dilutions of a standard; this straight line behaves as a calibration curve with direct application in X-ray fluorescence analysis. The proposed model may be applied to complex samples of geological origin, with elimination of the matrix effect. The results obtained in the determination of Ca, K, Fe and Ti in a standard soil show complete agreement with the certified reference values with a relative error about 0.5%, even using a standard shale with very different chemical composition as reference sample.
机译:我们从极限稀释法的启发中,从分析应用的角度提出了数学模型。给出了模型的理论发展及其结果。模型表明,荧光强度的倒数与稀释因子的倒数之间存在线性关系。每个分析系统(样品,稀释剂和分析物)的特征都是易于获得的一般线性函数。由这种线性引起的分析应用在X射线荧光分析中非常重要。提出以下直接应用:直接获得总校正因子Y / H,快速计算样品中分析物的荧光强度(I_i〜s)和直接计算校正后的荧光强度(I_i〜(sF))。建议的模型使得可以推断出连续稀释的标准液中分析物的荧光强度和分析物浓度之间的线性函数。该直线表现为直接在X射线荧光分析中应用的校准曲线。所建议的模型可以应用于具有地质起源的复杂样本,而无需考虑基质效应。即使使用化学成分差异很大的标准页岩作为标准样品,测定标准土壤中的Ca,K,Fe和Ti所获得的结果也与认证参考值完全吻合,相对误差约为0.5%。

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