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首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF METALLIC OXIDE MIXTURES APPLYING AN EMPIRICAL CALIBRATION TECHNIQUE
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QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF METALLIC OXIDE MIXTURES APPLYING AN EMPIRICAL CALIBRATION TECHNIQUE

机译:应用经验校正技术对金属氧化物混合物进行定量电子探针显微分析

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An analytical procedure is proposed for the independent quantitative chemical analysis of each element in the presence of other elements in the matrix of a sample by Energy Dispersive Electron Probe Microanalysis. For this purpose, an empirical calibration technique (which we shall call here the JABO method), which studies the variation of the X-ray intensities in terms of the analyte concentration in a chemical system with a complex matrix, is established. The methodology consists of the modification of the unknown sample by addition of a diluent, an internal standard and the analyte itself (dilution-addition method). A mathematical model is proposed to calculate the K parameters for the analyte (K-i) and standard (K-p) in each sample. A series of glass discs for each analyte are prepared which make it possible to obtain experimental values of characteristic X-ray lines. Some new K parameters are defined as K-i and K-p quotients, which remain constant in a wide concentration range. This allows us to use them for the calculation of the component concentrations of the unknown sample, as reproducing mathematical expressions between X-ray intensity and analyte concentration are obtained. An algorithm is proposed to calculate the component concentration in a sample with a complex matrix where components exist with a strong interelemental interaction effect. The method has been applied satisfactorily to the determination of titanium (accuracy 3%) and zinc (accuracy 0.5%) in the presence of a large proportion of zirconium which acts as interferent. (C) 1997 Elsevier Science B.V. [References: 29]
机译:提出了一种分析程序,用于通过能量分散电子探针微分析法在样品基质中存在其他元素的情况下,对每种元素进行独立的定量化学分析。为此,建立了一种经验校准技术(我们将其称为JABO方法),该技术研究具有复杂基质的化学系统中X射线强度相对于分析物浓度的变化。该方法包括通过添加稀释剂,内标和分析物本身对未知样品进行修饰(稀释加法)。提出了一个数学模型来计算每个样品中分析物(K-i)和标准品(K-p)的K参数。准备用于每种分析物的一系列玻璃圆盘,从而可以获取特征X射线线的实验值。一些新的K参数定义为K-i和K-p商,它们在宽浓度范围内保持恒定。当获得X射线强度和分析物浓度之间的数学表达式时,这使我们可以将它们用于计算未知样品的成分浓度。提出了一种计算复杂基质样品中组分浓度的算法,该组分存在且元素间相互作用强。在存在大量干扰物的锆的情况下,该方法已令人满意地用于测定钛(准确度3%)和锌(准确度0.5%)。 (C)1997 Elsevier Science B.V. [参考:29]

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