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Deposition of WO_3 doped amorphous hydrogenated carbon film by using liquid phase electrodeposition technique and its mechanical properties

机译:液相电沉积技术沉积WO_3掺杂非晶氢化碳膜及其力学性能

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摘要

Tungsten trioxide nanoparticles doped amorphous hydrogenated carbon (WO_3/a-C:H) films were successfully fabricated on silicon substrates by electrochemical deposition technique under atmospheric pressure. The as-deposited films were characterized by X-ray photoelectron spectroscopy, Transmission electron microscopy, Fourier transform infrared spectroscopy and Raman spectroscopy, respectively. Results showed that nanocrystalline tungsten trioxide particles with a grain size in the range of 8-12 nm were homogeneously embedded in the amorphous carbon matrix, and the sp~3-hybridized carbon content in the a-C:H films increased. Compared with pure amorphous carbon film, the hardness and elastic recovery were significantly improved due to the doping of WO_3. At the end, an understandable model was proposed to interpret the growth mechanism of the WO_3/a-C:H composite films.
机译:在大气压下,通过电化学沉积技术成功地在硅衬底上制备了掺杂三氧化钨纳米颗粒的非晶态氢化碳(WO_3 / a-C:H)薄膜。分别通过X射线光电子能谱,透射电子显微镜,傅立叶变换红外光谱和拉曼光谱来表征所沉积的膜。结果表明,晶粒尺寸在8-12 nm之间的纳米晶三氧化钨颗粒均匀地嵌入非晶碳基质中,并且a-C:H膜中的sp〜3-杂化碳含量增加。与纯非晶碳膜相比,WO_3的掺杂显着提高了硬度和弹性回复率。最后,提出了一种可理解的模型来解释WO_3 / a-C:H复合膜的生长机理。

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