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首页> 外文期刊>SIAM Journal on Mathematical Analysis >NEW UNIQUENESS THEOREMS FOR THE ONE-DIMENSIONAL DRIFT-DIFFUSION SEMICONDUCTOR DEVICE EQUATIONS
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NEW UNIQUENESS THEOREMS FOR THE ONE-DIMENSIONAL DRIFT-DIFFUSION SEMICONDUCTOR DEVICE EQUATIONS

机译:一维漂移-扩散半导体器件方程的新唯一性定理

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摘要

We consider the one-dimensional drift-diffusion semiconductor device equations, under the assumption of zero generation-recombination. The uniqueness theorems that are given in the literature for this system do not hold for large values of the applied bias. The purpose of this paper is to introduce new techniques, which allow us to prove uniqueness theorems, in the case of symmetric p-n and p-i-n junctions, which are valid for arbitrary values of the applied bias. These techniques are essentially based on new monotonicity principles. As a direct consequence of these principles, we prove that the voltage-current characteristic of a symmetric p-n or p-i-n junction is strictly increasing. [References: 20]
机译:在零生成复合的假设下,我们考虑一维漂移扩散半导体器件方程。对于该系统,文献中给出的唯一性定理不适用于较大的施加偏差值。本文的目的是介绍新技术,这些技术使我们能够证明在对称p-n和p-i-n结的情况下的唯一性定理,这对于施加的偏置的任意值均有效。这些技术基本上基于新的单调性原理。作为这些原理的直接结果,我们证明了对称p-n或p-i-n结的电压-电流特性正在严格增加。 [参考:20]

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