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Nanostructured Zinc Oxide Thin Films for NO_2 Gas Sensing

机译:用于NO_2气敏的纳米结构氧化锌薄膜

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摘要

In this work, thin ZnO films were grown on glass substrates using the spray pyrolysis method. The deposited ZnO films were investigated by X-Ray Diffraction (XRD) and Atomic Force Microscopy (AFM). XRD patterns show that ZnO has a polycrystalline structure with a preferential growth orientation along the c-axis (002) plane. The mean crystallite size dimension estimated from XRD patterns was found to be around 65 nm. AFM images showed that ZnO films are composed of uniformly distributed ZnO nanocrystallites forming granular, rough and porous structure. The crystallite size dimension estimated from AFM images is in the 30-70 nm range, which is in agreement with that obtained from XRD. The features of these films were found to be suitable for sensing toxic gases such as NO_2. For this purpose the electrical response of the ZnO films were measured under constant air flow at various NO_2 concentrations. The ZnO films-based sensor was found to have fast and high response with an acceptable recovery delay, at relatively low working temperature (210℃) for NO_2 concentration ranging from 5 ppm to 200 ppm. Stable and rather satisfactory recovery delay ZnO-based sensor having reproducible response was pointed out at an operating temperature of 210℃.
机译:在这项工作中,使用喷雾热解法在玻璃基板上生长了ZnO薄膜。通过X射线衍射(XRD)和原子力显微镜(AFM)研究了沉积的ZnO薄膜。 XRD图谱表明ZnO具有沿c轴(002)平面具有优先生长取向的多晶结构。由XRD图谱估计的平均微晶尺寸尺寸被发现为约65nm。原子力显微镜图像表明,ZnO薄膜由均匀分布的ZnO纳米晶体组成,形成颗粒,粗糙和多孔的结构。从AFM图像估计的微晶尺寸尺寸在30-70nm范围内,这与从XRD获得的尺寸一致。发现这些膜的特征适合于感测有毒气体,例如NO_2。为此目的,在各种NO_2浓度下在恒定气流下测量ZnO薄膜的电响应。发现基于ZnO薄膜的传感器在相对较低的工作温度(210℃)下,NO_2浓度在5 ppm至200 ppm之间时,响应速度快,响应延迟快。指出在210℃的工作温度下具有可重复响应的稳定且令人满意的恢复延迟ZnO基传感器。

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