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Bi-Ge-Sb-Sn-Te films for reversible phase-change optical recording

机译:Bi-Ge-Sb-Sn-Te薄膜用于可逆相变光学记录

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摘要

Bi-Ge-Sb-Sn-Te phase-change recording films (Films A-D) were prepared by the co-sputtering of Bi_(30)Ge_(10)Te_(60), Ge_(20)Sb_(80), Sb and Sn targets. The composition of the recording films was controlled by the dc power. The film composition, surface roughness and reflectivity were also closely related. Dynamic tests revealed that disks with Film C exhibited a low jitter value and a high modulation value after direct overwriting. Therefore, the composition of the recording film dominated the reversible recording properties of the phase-change optical disk.
机译:通过共溅射Bi_(30)Ge_(10)Te_(60),Ge_(20)Sb_(80),Sb和Bi-Ge制备Bi-Ge-Sb-Sn-Te相变记录膜(电影AD)。 Sn目标。记录膜的组成由直流电源控制。膜的组成,表面粗糙度和反射率也密切相关。动态测试表明,带有胶片C的磁盘在直接覆盖后表现出较低的抖动值和较高的调制值。因此,记录膜的成分决定了相变光盘的可逆记录特性。

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