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Photo luminescence study of Nd3+-doped Si-rich silica films

机译:掺Nd3 +的富硅二氧化硅薄膜的光致发光研究

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Nd3+-doped silicon-rich silicon oxide thin films have been fabricated by reactive magnetron co-sputtering of a pure silica target topped with Nd2O3 chips. The incorporation of silicon excess in the films has been controlled by the hydrogen partial pressure Pit, introduced in the plasma. Photoluminescence experiments have been made at room temperature using a non resonant excitation with Nd3+ ions. The influences of Nd3+ content and P-H2 have been studied to improve the Nd3+ emission. Photoluminescence spectra reveal an enhancement of the Nd3+ emission at 0.9 mu m and 1.1 mu m when silicon nanoclusters and Nd3+ are embedded in a SiO2 matrix.
机译:掺杂Nd3 +的富硅氧化硅薄膜已经通过反应磁控共溅射具有Nd2O3芯片的纯二氧化硅靶材进行了共溅射。膜中过量硅的掺入已由引入等离子体中的氢分压Pit控制。使用Nd3 +离子的非共振激发在室温下进行了光致发光实验。研究了Nd3 +含量和P-H2对改善Nd3 +排放的影响。当硅纳米团簇和Nd3 +嵌入SiO2基质中时,光致发光光谱显示Nd3 +的发射在0.9μm和1.1μm处增强。

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