首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >THE DELANO GAMMA-(GAMMA)OVER-BAR DIAGRAM APPLIED TO OPTICAL SYSTEM SYNTHESIS AND OPTIMIZATION, GAMMA-(GAMMA)OVER-BAR DIAGRAM POINT DISPLACEMENTS
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THE DELANO GAMMA-(GAMMA)OVER-BAR DIAGRAM APPLIED TO OPTICAL SYSTEM SYNTHESIS AND OPTIMIZATION, GAMMA-(GAMMA)OVER-BAR DIAGRAM POINT DISPLACEMENTS

机译:DELANO GAMMA-(GAMMA)圆弧图应用于光学系统的合成和优化,GAMMA-(GAMMA)圆弧图的点位移

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This paper is concerned with the equations representing the differential increments introduced to Seidel surface aberration contributions at three consecutive points (j - 1, j,j + 1), in a y - (y) over bar diagram representing an arbitrary optical system, when the central one (j) becomes displaced along its conjugate, object and image space lines. The equations representing the differential increments of the Seidel aberrations in the y - (y) over bar diagram design space are reported here for the first time. These equations are the complete set of 35 differential increments of surface Seidel aberration contributions, given in four tables, and the optical system's Seidel aberration sums as a set of 12 equations in 4 tables. All these equations are given as functions of y - (y) over bar design space independent variables, paraxial ray trace data and each corresponding aberration's value, as evaluated in the optical system's original configuration. The structural similitude featured by these equations, and the recurrent application of an optical system synthesis subroutine, has simplified the development of a fast and accurate automatic optimization procedure in y - (y) over bar design space. [References: 6]
机译:本文关注的方程式表示在三个连续点(j-1,j,j + 1)上引入Seidel表面像差贡献的微分增量,在表示任意光学系统的条形图中的ay-(y)上,当中心(j)沿其共轭,物和像空间线移位。首次在条形图设计空间上报告了表示y-(y)上Seidel像差的微分增量的方程式。这些方程式是完整的35个表面Seidel像差贡献的微分增量集(在四个表格中给出),而光学系统的Seidel像差总和在4个表格中是12个方程式的集合。所有这些等式均作为y-(y)的函数给出,它们是在光学系统的原始配置中评估的,它们与棒设计空间无关的变量,近轴光线跟踪数据以及每个相应的像差值有关。这些方程式所具有的结构相似性以及光学系统综合子程序的反复应用,简化了在棒设计空间上y-(y)的快速准确自动优化程序的开发。 [参考:6]

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