首页> 外文期刊>RSC Advances >p-Type doping of tetrafluorotetracynoquinodimethane (F(4)TCNQ) in poly(para-phenylene vinylene) (PPV) derivative 'Super Yellow' (SY)
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p-Type doping of tetrafluorotetracynoquinodimethane (F(4)TCNQ) in poly(para-phenylene vinylene) (PPV) derivative 'Super Yellow' (SY)

机译:在聚对苯撑亚乙烯基(PPV)衍生物“超级黄”(SY)中的四氟四氰基对二甲烷(F(4)TCNQ)的p型掺杂

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摘要

In this paper, we report a case of hole transport in tetrafluorotetracynoquinodimethane doped poly(para-phenylene vinylene) derivative "Super Yellow". The hole mobility of pristine and doped polymer thin films was determined by impedance spectroscopy. The increase in hole mobility upon doping was also verified by current density-voltage measurements. It was found to be increased by two orders of magnitude upon doping. The increase in hole mobility upon p-type doping was explained on the basis of extended Gaussian disorder model by measuring current density-voltage characteristics in the same devices. At low bias, J-V characteristics exhibit clear space charge limited conduction in pristine state but ohmic behaviour when doped. Further, at higher voltages the current density increases non-linearly due to the field-dependent mobility and carrier concentration by filling of tail states of highest occupied molecular orbital of the host material. The room temperature J-V characteristics were well described with the single value of free hole density at low fields. At higher fields it becomes field-dependent followed by a field enhancement factor gamma.
机译:在本文中,我们报道了在四氟四氰基喹二甲烷掺杂的聚对苯撑亚乙烯基衍生物“超级黄”中发生空穴传输的情况。原始和掺杂的聚合物薄膜的空穴迁移率通过阻抗光谱法确定。掺杂时空穴迁移率的增加也通过电流密度-电压测量来证实。发现在掺杂时它增加了两个数量级。在扩展的高斯无序模型的基础上,通过测量相同器件中的电流密度-电压特性,解释了p型掺杂时空穴迁移率的增加。在低偏置下,J-V特性在原始状态下表现出明显的空间电荷受限传导,但在掺杂时表现出欧姆行为。此外,在较高的电压下,电流密度由于依赖于场的迁移率和载流子浓度而非线性增加,这是通过填充主体材料占据最高的分子轨道的尾态来实现的。室温下的J-V特性很好地描述了低场的自由孔密度的单个值。在更高的场,它变得取决于场,其后是场增强因子γ。

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