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Measurement of Cu K and Ag,In and Sn L X-ray production cross sections by low-energy positron impact

机译:用低能正电子冲击测量Cu K和Ag,In和Sn L X射线的生产​​截面

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摘要

Cu K and Ag,In and Sn L X-ray production cross sections by positron impact have been determined experimentally in the energy range below 30 keV using an X-ray detector with thin Si(Li)crystals.These values have been compared with theoretical estimates derived using the binary encounter formalism.The values for Cu K and Ag L X-rays have also been compared with the results of theoretical calculations using the plane-wave Born approximation with Coulomb and relativistic corrections.
机译:通过使用薄Si(Li)晶体的X射线探测器,在30 keV以下的能量范围内,通过实验确定了由正电子撞击产生的Cu K和Ag,In和Sn L X射线的横截面,并将这些值与理论值进行了比较Cu K和Ag L X射线的值也已与使用库仑平面波Born近似和相对论校正的理论计算结果进行了比较。

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