Surface fitting - new tool for spectrally resolved thermoluminescence analysis

摘要

Numerical deconvolution and curve-fitting algorithms are routinely used for the analysis of complex thermoluminescence (TL) data. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. In this paper we present new 'surface fitting' algorithm. Spectrally resolved TL surface is numerically deconvoluted for individual surface peaks corresponding to trap levels and recombination centres. This technique allows simultaneous determination of activation energies of traps and the emission bands associated with recombination centres utilizing all measured data points. To demonstrate possibilities of the method we applied the algorithm to numerical deconvolution of spectrally resolved TL data measured for high-sensitive LiF:Mg,Cu,P thermoluminescent detector. (C) 2004 Elsevier Ltd. All rights reserved.