首页> 外国专利> Arrangement for rapid locally resolved flat surface spectroscopic analysis or imaging has flat raster array of pinholes turned about acute angle relative to spectral axis on detector matrix which fills up with elongated su-matrices

Arrangement for rapid locally resolved flat surface spectroscopic analysis or imaging has flat raster array of pinholes turned about acute angle relative to spectral axis on detector matrix which fills up with elongated su-matrices

机译:用于快速局部分辨平面光谱分析或成像的装置具有针孔的相对于检测器矩阵上的光谱轴成锐角旋转成锐角的平面光栅阵列,该阵列填充了细长的超矩阵

摘要

The arrangement has a flat raster array (5) of pinholes with optical copying system (6), a flat surface detector matrix (9) in the detection ray path and with means (7) for lateral spectral splitting and focussing means (9). The flat array is turned about an acute angle relative to the spectral axis on the detector matrix and through rotation a connecting line of pinholes when projected includes an acute angle with the spectral axis and the detector matrix is filled up more or less completely with elongated submatrices (9a,9b) arranged parallel to the spectral axis but not overlapping. Independent claim describes method for 3-D detection by spectroscopy with chromatic calibration producing a single at least partially spectrally defined reference light bundle.
机译:该装置具有带有光学复制系统(6)的针孔的平坦栅格阵列(5),在检测射线路径中的平坦表面检测器矩阵(9)以及用于横向光谱分裂和聚焦装置(9)的装置(7)。将平面阵列相对于检测器矩阵上的光谱轴旋转成锐角,并通过旋转使投影时的针孔连接线与光谱轴成锐角,并且检测器矩阵或多或少完全被细长的子矩阵填充(9a,9b)平行于光谱轴但不重叠。独立权利要求描述了通过具有色校准的光谱的3-D检测的方法,该方法产生单个至少部分光谱限定的参考光束。

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