Growth and performance of pulsed laser deposited indium oxide thin-film holographic recorders

摘要

We report the growth of indium oxide (InOx) holographic recorders on glass substrates by Pulsed Laser Deposition (PLD). Deposition runs were carried out using pure indium targets at various oxygen ambient pressures. Microstructural and compositional properties of the films grown were studied by X-Ray Diffraction analysis (XRD) and Rutherford Backscattering Spectroscopy (RES). Dynamic recording of holographic gratings is observed in these films by using a HeCd laser emitting at lambda = 325 nm. A strong dependence of the recording characteristics on the film microstructure was observed. This suggests that the crystalline structure and/or the presence of oxygen vacancies are factors influencing the recording mechanism. The potential control of the response and storage time in this material by the growth conditions is of extreme interest in the holographic information storage and processing applications. [References: 12]