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The Structure and Photoelectrochemistry of Al, Ti Co-Doped Zinc Oxide Thin Films Prepared by Sol-Gel Dip-Coating Process

机译:溶胶-凝胶浸涂法制备Al,Ti共掺杂氧化锌薄膜的结构和光电化学

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Al, Ti co-doped ZnO (ATZO) thin films were prepared on glass substrate via sol-gel dip-coating process. Importantly, we replaced the toxic 2-methoxy-ethanol by nontoxic ethanol as a much safer reagent. The dip-coating was repeated four times and as-obtained thin films were then annealed at 500℃ for 1 h in air. We found that introducing Al and Ti dopant would transfer the principal diffraction peak from (101) to (002), decrease the vibration strength of E_2 high and E_1 LO, lead a relative smoother surface, blueshift the band gap, decrease resistance and increase photocurrent density. Also, doping Al and Ti arose the open circuit potential and as a result, increased the anticorrection of ATZO films.
机译:通过溶胶-凝胶浸涂法在玻璃基板上制备了Al,Ti共掺杂ZnO(ATZO)薄膜。重要的是,我们用无毒乙醇代替了有毒的2-甲氧基乙醇,这是一种更为安全的试剂。重复浸涂四次,然后将获得的薄膜在500℃的空气中退火1小时。我们发现引入Al和Ti掺杂剂将使主衍射峰从(101)转移到(002),降低E_2 high和E_1 LO的振动强度,使表面相对平滑,使带隙蓝移,减小电阻并增加光电流密度。而且,掺杂Al和Ti引起开路电势,结果增加了ATZO膜的抗校正性。

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