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Correlative infrared–electron nanoscopyreveals the local structure–conductivityrelationship in zinc oxide nanowires

机译:红外-电子纳米技术的相关性揭示了氧化锌纳米线中的局部结构-电导率关系

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High-resolution characterization methods play a key role in the development, analysis andoptimization of nanoscale materials and devices. Because of the various material properties,only a combination of different characterization techniques provides a comprehensiveunderstanding of complex functional materials. Here we introduce correlative infrared–electronnanoscopy, a novel method yielding transmission electron microscope and infrared near-fieldimages of one and the same nanostructure. While transmission electron microscopy providesstructural information up to the atomic level, infrared near-field imaging yields nanoscale mapsof chemical composition and conductivity. We demonstrate the method’s potential by studyingthe relation between conductivity and crystal structure in Zno nanowire cross-sections. Thecombination of infrared conductivity maps and the local crystal structure reveals a radial freecarrier gradient, which inversely correlates to the density of extended crystalline defects. ourmethod opens new avenues for studying the local interplay between structure, conductivityand chemical composition in widely different material systems.
机译:高分辨率表征方法在纳米级材料和器件的开发,分析和优化中起着关键作用。由于各种材料特性,只有不同的表征技术的组合才能对复杂的功能材料提供全面的了解。在这里,我们介绍相关的红外电子显微术,这是一种产生透射电子显微镜和具有相同纳米结构的红外近场图像的新方法。透射电子显微镜可提供高达原子水平的结构信息,而红外近场成像可产生化学组成和电导率的纳米级图。我们通过研究Zno纳米线截面中电导率与晶体结构之间的关系来证明该方法的潜力。红外电导率图和局部晶体结构的组合揭示了径向自由载流子梯度,其与扩展的晶体缺陷的密度成反比。我们的方法为研究广泛不同的材料系统中结构,电导率和化学成分之间的局部相互作用开辟了新途径。

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