Scanning force microscopy three-dimensional modes applied to conductivity measurements through linear-chain organic SAMs - art. no. 125505

摘要

We present here a new approach, based on the use of three-dimensional operation modes of scanning force microscopy. The protocol used reveals the advantages of independent but simultaneous data acquisition to discriminate between different interaction regimes and obtain accurate measurements. The procedure is applied to investigate the conducting characteristics of submonolayer linear-chain organic films for which the bare metallic substrate provides an excellent in situ reference for molecular lattice periodicity, film thickness determination and conductivity measurements.