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Low temperature synthesized Sn doped indium oxide nanowires

机译:低温合成锡掺杂氧化铟纳米线

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摘要

Selective, well controlled and directionally grown Sn doped In_2O_3 nanowires (In_2O_3: Sn nanowires, SIO NWs) were synthesized at a low fabrication temperature (approx 770 deg C) through a vapour-liquid-solid (VLS) process under a precise carrier gas flow. The majority of the SIO NWs are grown along [222], with [400] and [440] as minority forming directions, which implies a nearly epitaxial crystal structure. There are fewer physical defects, such as line or planar defects and contaminations, in the SIO NWs than in pure In_2O_3 nanowires seen through high resolution transmission electron microscopy (HR-TEM) observations. The spectrum of photoluminescence (PL) emission indicates a stable strong blue light peak located at approx 440 nm with an excited wavelength of 275 nm at room temperature. The Sn dopant in the SIO NWs can enhance the conductivity of the nanowires leading to the lowering of the turn-on electric-field to 0.66 V mu m~(-1) under a current density of up to 1.0 mA cm~(-2) based on their field emission characteristics. Furthermore, the field emission enhancement coefficient, beta, is also increased to 1.48 X 10~5, which is very close to the carbon nanotube, (CNT) level. SIO NWs fabricated by a VLS process offer a potential application in flat panel displays as demonstrated in this study.
机译:在精确的载气流下,通过汽-液-固(VLS)工艺在低制造温度(约770摄氏度)下合成了选择性,控制良好且定向生长的掺Sn In_2O_3纳米线(In_2O_3:Sn纳米线,SIO NW)。 。大多数SIO NW沿[222]生长,其中[400]和[440]为少数形成方向,这意味着几乎是外延晶体结构。通过高分辨率透射电子显微镜(HR-TEM)观察,与纯In_2O_3纳米线相比,SIO NW中的物理缺陷(例如线或平面缺陷和污染)更少。光致发光(PL)发射光谱表明,在室温下,稳定的强蓝光峰位于大约440 nm处,激发波长为275 nm。 SIO NW中的Sn掺杂剂可以增强纳米线的电导率,从而在电流密度高达1.0 mA cm〜(-2)时将导通电场降低至0.66 Vμmm·(-1) )基于其场发射特性。此外,场发射增强系数β也增加到1.48 X 10〜5,非常接近碳纳米管(CNT)的水平。如本研究所示,通过VLS工艺制造的SIO NW在平板显示器中具有潜在的应用前景。

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