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Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy

机译:非绝缘原子力显微镜对半绝缘聚合物单晶的分子尺度研究

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摘要

Surfaces of polymerized 2,4-hexadiyne-l,6 bis(p-toluene-sulphonate) (poly-PTS) single crystals were investigated on a molecular scale by noncontact atomic force microscopy (NC-AFM). Molecularly resolved images of the surface structures, the energy dissipation and the surface potential (SP) distribution were successfully obtained. The possible origins of energy dissipation are discussed in terms of the relationship with the molecular fluctuation. Furthermore, to ascertain the origin of the SP distribution, the obtained SP image was compared with the calculated local charges on the individual atoms forming the molecule.
机译:通过非接触原子力显微镜(NC-AFM)在分子尺度上研究了聚合的2,4-己二炔-1,6双(对甲苯磺酸盐)(poly-PTS)单晶的表面。成功获得了表面结构,能量耗散和表面电势(SP)分布的分子分辨图像。根据与分子涨落的关系讨论了能量消散的可能根源。此外,为了确定SP分布的起源,将获得的SP图像与计算出的形成分子的单个原子上的局部电荷进行比较。

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