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Empirical expression for the emission site density of nanotube film emitters

机译:纳米管薄膜发射器发射点密度的经验表达式

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The influence of surface roughness on emission site density (ESD) is investigated for nanotube film emitters. An empirical expression for film emitters, ESD = 1/A(CNT)e(B-lnC), where B is the intercept in the modified Fowler-Nordheim (FN) plots, A(CNT) the emission area of one site, and C related to the work function, is derived from the FN theory and experimentally proved. This expression effectively excludes the influence of electric field strength, being different from the conventional method of counting site numbers from emission patterns. By using this equation and emission patterns, variation in ESD, induced by the change in cathode-anode distance, is confirmed for film emitters with rough surfaces. This variation is ascribed to the change in screen-effect strength among emission sites. It is also found that the smaller gaps produce the higher emission uniformity and site densities for rough-surface film emitters.
机译:对于纳米管薄膜发射器,研究了表面粗糙度对发射位点密度(ESD)的影响。薄膜发射器的经验表达式ESD = 1 / A(CNT)e(B-lnC),其中B是修改的Fowler-Nordheim(FN)图中的截距,A(CNT)一个位置的发射面积,以及与功函数有关的C源自FN理论并通过实验证明。该表达式有效地排除了电场强度的影响,这与传统的从发射图计数站点数的方法不同。通过使用该方程式和发射模式,对于具有粗糙表面的薄膜发射器,可以确定由于阴极到阳极距离的变化而引起的ESD变化。这种变化归因于发射位置之间的屏幕效应强度的变化。还发现,较小的间隙对于粗糙表面的薄膜发射器产生较高的发射均匀性和位点密度。

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