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The effects of contacts and ambipolar electrical transport in nitrogen doped multiwall carbon nanotubes

机译:氮掺杂多壁碳纳米管中接触和双极电传输的影响

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The electrical transport properties of pristine single wall carbon nanotubes (SWCNTs) and lower nitrogen content doped multiwall carbon nanotubes (MWCNTs) (lower than in the experiments of Xiao et al (2005 J. Am. Chem. Soc. 127 8614)) in contact with Au and Pt were studied. Compared with pristine SWCNTs, the Fermi level of the lower nitrogen content doped MWCNTs also moved to the valence band edge with the contact metal's work function increasing. In contrast to Derycke et al's results (2002 Appl. Phys. Lett. 80 2773), the lower nitrogen content doped MWCNTs exhibited ambipolar behavior, and increasing the doping level led to a reduction of the Schottky barrier height of electrons. Consistent with theoretical calculations, the results support the opinion that the degree of Fermi level pinning is minor for doped carbon nanotubes.
机译:原始的单壁碳纳米管(SWCNT)和较低氮含量掺杂的多壁碳纳米管(MWCNT)的电传输特性(低于Xiao等人的实验(2005 J. Am。Chem。Soc。127 8614))用金和铂进行了研究。与原始SWCNT相比,随着接触金属功函数的增加,较低氮含量掺杂的MWCNT的费米能级也移至价带边缘。与Derycke等人的结果(2002 Appl。Phys。Lett。80 2773)相反,较低氮含量掺杂的MWCNT表现出双极性行为,并且增加掺杂水平导致电子的肖特基势垒高度降低。与理论计算一致,该结果支持以下观点:对于掺杂的碳纳米管,费米能级钉扎的程度较小。

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