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Boundary Scan Test for FPGA-Based Embedded Design

机译:基于FPGA的嵌入式设计的边界扫描测试

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摘要

System features integrated into modern FPGAs allow designers to implement an increasing proportion of an embedded design in a small number of reconfigurable components. It is quite normal to take advantage of the FPGA's reconfigurability to download test programs to exercise various parts of the system and to perform self-test routines in the field. During development and prototyping, however, engineers must debug hardware before functional tests are ready. But the presence of the system features that are so valuable to the end product increasingly rules out the use of conventional probe-based test techniques.
机译:集成到现代FPGA中的系统功能使设计人员可以在少量可重新配置的组件中实现越来越多的嵌入式设计。利用FPGA的可重新配置性来下载测试程序来练习系统的各个部分并在现场执行自测程序是很正常的。但是,在开发和原型制作期间,工程师必须在功能测试准备就绪之前调试硬件。但是,对于最终产品而言如此宝贵的系统功能的存在越来越多地排除了使用基于常规探针的测试技术的可能性。

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