基于FPGA的边界扫描测试系统设计

摘要

随着集成电路技术的快速发展，传统的PCB电路板测试所采用探针的方法已经不现实，边界扫描技术解决了这一传统的PCB板测试的难题。本文设计的边界扫描测试系统可以实现对JTAG的访问以及完成对被测电路板器件IDCODE等方面的测试。实验结果表明，该系统测试方便，简单。%With the rapid development of integrated circuit technology,traditional PCB circuit board test methods used in the probe have many problems.Boundary-scan technology solve the traditional problems of PCB board testing.Boundary_scan test system designed in this paper can achieve to access to the JTAG and complete the IDCODE test on the device of the circuit boards.Experimental results show that the system testing convenient and simple.