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Identification of quantitative trait loci involved in the response of common bean to Pseudomonas syringae pv. phaseolicola

机译:鉴定涉及普通豆对丁香假单胞菌PV应答的数量性状基因座。菜豆

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Halo blight, caused by Pseudomonas syringae pv. phaseolicola (Burkn.) Downs (Psp), is an important disease in common bean (Phaseolus vulgaris L.). This study investigated the genetic control of the resistance to two local isolates of Psp (ITA-812 and ITA-684) in a recombinant inbred line (RIL) population derived from the cross between the bean genotypes Xana and Cornell 49242. The cultivar Cornell 49242 exhibited moderate resistance to these isolates, whereas cultivar Xana was susceptible. The RIL population showed a continuous variation in response to the two isolates. Analysis revealed four significant quantitative trait loci (QTLs): Psp4(812XC) and Psp6.1(812XC) located on linkage groups Pv04 and Pv06 (for the response to isolate ITA-812), and Psp6.1(684XC) and Psp6.2(684XC) located on Pv06 (for the response to isolate ITA-684). The QTLs Psp6.1(812XC) and Psp6.1(684XC) were located in the same genetic region (Psp6.1), close to the Psp6.2 region in which the QTL Psp6.2(684XC) was mapped. A genetic dissection was undertaken to verify the consistency of these three QTLs located on the end of Pv06. Four sets of RILs were established according to the genotypes (Xana and Cornell 49242) of the underlying markers for the regions Psp6.1 and Psp6.2. Re-evaluation of these sets of lines revealed significant differences relative only to isolate ITA-684. The set of lines with the Cornell genotype in both regions was significantly more resistant than the other three sets of lines. This suggested that both regions were necessary to detect a significant effect in the response to isolate ITA-684. In the physical positions corresponding to these two genetic regions, in silico analysis revealed 16 candidate genes (putative orthologous genes) that carried sequences homologous to the resistance genes RPM1, FLS2, RPG1/RPG1-B, and Pto-all of which confer resistance to P. syringae in different species. The results confirm that, apart from the major genes implicated in resistance to Psp, specific bean genotypes exhibit a quantitative mode of inheritance of resistance to Psp.
机译:光环枯萎病,由丁香假单胞菌PV引起。菜豆(Burkn。)Downs(Psp)是普通豆(Phaseolus vulgaris L.)的重要病害。这项研究调查了遗传自交配系(RIL)中对两个本地Psp分离株(ITA-812和ITA-684)的抗性的遗传控制,该重组自交系来自豆子基因型Xana和Cornell 49242的杂交。Cornell栽培品种49242表现出对这些分离株的中等抗性,而Xana品种易感。 RIL群体显示出对这两种分离株的连续变化。分析揭示了四个重要的数量性状基因座(QTL):位于连锁组Pv04和Pv06(用于分离ITA-812的响应)上的Psp4(812XC)和Psp6.1(812XC),以及Psp6.1(684XC)和Psp6。位于Pv06上的2(684XC)(用于隔离ITA-684的响应)。 QTL Psp6.1(812XC)和Psp6.1(684XC)位于相同的遗传区域(Psp6.1),靠近QTL Psp6.2(684XC)所在的Psp6.2区域。进行了遗传解剖以验证位于Pv06末端的这三个QTL的一致性。根据针对Psp6.1和Psp6.2区域的基础标记的基因型(Xana和Cornell 49242)建立了四组RIL。对这些品系的重新评估显示出仅与分离的ITA-684相比存在显着差异。在两个区域中具有康奈尔基因型的品系组比其他三组品系具有更高的抗性。这表明这两个区域对于检测对ITA-684的应答均具有显著作用是必要的。在与这两个遗传区域相对应的物理位置中,计算机模拟分析揭示了16个候选基因(假定的直系同源基因),它们带有与抗性基因RPM1,FLS2,RPG1 / RPG1-B和Pto同源的序列,所有这些都赋予了对丁香假单胞菌在不同物种中。结果证实,除了牵连对Psp抗性的主要基因外,特定的豆基因型还表现出对Psp抗性遗传的定量模式。

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