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Comparative harmonic loss measurement in grain oriented and non-oriented magnetic sheets using a precision single-sheet tester

机译:使用精密单片测试仪对晶粒取向和非取向磁性片进行谐波损耗比较测量

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Although total flux is usually sinusoidal in magnetic cores, local flux may be distorted in some of their regions. While attempting to predict the loss distribution in materials operating under localized distorted flux conditions, which may occur in electromagnetic machines and transformer cores, it is very essential that proper account of the waveform be taken. Moreover for the development of new magnetic materials and the generation of better magnetic sheets, it is necessary to implement detailed measurement for their property specifications. One of these property specifications is the loss under distorted flux conditions. A high precision single-sheet tester (SST) was implemented in which the specification of the sample sheet will be measured by software processing of B and H. The finite-element method was used for the magnetic field study. The field distribution was calculated inside and outside the sample, through which the error was obtained. By a different section of the winding in exciting coil, the field uniformity was improved and finally the implemented system shows error less than 0.6% in the measurement of hysteresis loss of magnetic sheets. The loss due to distorted flux was measured for different harmonics and in distinct amplitudes and phases. A range of non-oriented and grain oriented materials was tested under distorted flux waveform conditions. For non-oriented sheets, the loss was measured about 10% by applying 15% third harmonic to exciting waveform, while this value was about 25% for many grain oriented sheets. Moreover, based on implemented measurements, the harmonic phase affects the loss and makes about 22% error in loss prediction for non-oriented sheets.
机译:尽管总磁通量在磁芯中通常为正弦波,但局部磁通量在某些区域可能会失真。在试图预测在局部畸变的通量条件下工作的材料中的损耗分布时(可能会在电磁电机和变压器铁芯中发生),必须适当考虑波形,这一点非常重要。此外,为了开发新的磁性材料和产生更好的磁性片,有必要对其性能规格进行详细的测量。这些性能指标之一是磁通失真条件下的损耗。实施了一种高精度单片测试仪(SST),其中样品片的规格将通过B和H的软件处理进行测量。磁场研究采用了有限元方法。计算样品内部和外部的场分布,从而获得误差。通过励磁线圈中绕组的不同截面,改善了磁场均匀性,最终所实现的系统在测量磁性片的磁滞损耗方面显示出小于0.6%的误差。对于不同的谐波以及不同的振幅和相位,测量了由于通量失真所引起的损耗。在畸变的磁通波形条件下测试了一系列非取向和晶粒取向材料。对于非取向片材,通过将15%三次谐波施加到激励波形上,损耗约为10%,而对于许多晶粒取向片材,该值约为25%。此外,基于已实施的测量,谐波相位会影响损耗,并在非定向板材的损耗预测中产生约22%的误差。

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