Standardizing the metrological assessment of waveform digitizers: problems and perspectives

摘要

The problem of the metrological qualification of data acquisition systems and of waveform recorders is a fundamental issue for both users and manufacturers of digital instruments. The need for an improved industry standard leading to utification and standardization in this field is a very pressing requirement. Users have to receive technical specifications written in standard format and manufacturers have to obtain this information following standard test procedures. The main goal of this paper is to underline the need of unifying the modeling, identification and optimization of ADC-based systems, by minimizing the number of experimental procedures to be employed. This work, more than giving solutions, is intended to state clearly a set of problems that we hope will gain the attention of researchers in this field.