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首页> 外文期刊>Modern Physics Letters, B. Condensed Matter Physics, Statistical Physics, Applied Physics >Vacancy induced Jahn-Teller distortion in silicon and its influence to the electronic structure
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Vacancy induced Jahn-Teller distortion in silicon and its influence to the electronic structure

机译:硅中空位引起的Jahn-Teller畸变及其对电子结构的影响

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摘要

Atomic and electronic structures of monovacancy (V1), divacancy (V2) and ring hexa-vacancy (V6) in crystalline silicon are studied using first-principles calculations in periodic supercells. Our results show that the V6 defect is the most stable among V1, V2 and V6 defects, and the V2-RB structure is a little more stable than the V2-LP structure due to lower vacancy formation energy. Furthermore, it is found that both V1 and V2 undergo the Jahn-Teller (JT) distortion while V6 does not. As a result, V1 and V2 have deep levels in the gap which mainly come from the neighboring atoms to vacancy. V6 has tailing bands in the gap, and so has a more stable electronic structure than V1 and V2. In addition, the JT distortion also reflects in the band decomposed charge density and the difference charge density.
机译:使用周期超级单元中的第一性原理研究了晶体硅中的单空位(V1),双空位(V2)和环六空位(V6)的原子和电子结构。我们的结果表明,V6缺陷在V1,V2和V6缺陷中最稳定,并且由于空位形成能较低,V2-RB结构比V2-LP结构更稳定。此外,发现V1和V2都发生了Jahn-Teller(JT)失真,而V6没有。结果,V1和V2在间隙中具有很深的能级,主要来自相邻原子到空位。 V6在间隙中具有拖尾带,因此具有比V1和V2更稳定的电子结构。另外,JT失真还反映在带分解的电荷密度和差分电荷密度。

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